@conference {
	title = {Sequential Testing on the Rate of a Counting Process},
	author = {Baras, John S., MacEnany, David C.},
	year = {1987},
	month = {12/1987},
	abstract = {In this paper, optimality results are given for the problems of Bayesian and Wald sequential (simple, binary) hypothesis testing on the rate of a counting process. An explicit formula is given for the Bayes risk, and the system to solve for the exact optimal thresholds is also given.},
	address = {Los Angeles, California},
	booktitle = {The 26th IEEE Conference on Decision and Control},
	pages = {pp. 1592-1593}
}
@conference {
	title = {The DELPHI System:  A System Level Tool for Integrated Design of Real-Time Signal Processors},
	author = {Baras, John S., Ebrahimi, Fariborz., Israel, Bruce., LaVigna, Anthony., MacEnany, David C.},
	year = {1987},
	month = {08/1987},
	address = {San Diego, CA},
	booktitle = {SPIE{\textquoteright}s 31st Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, in Real Time Signal Processing X},
	pages = {pp. 10-14}
}
